Please use this identifier to cite or link to this item: https://idr.l2.nitk.ac.in/jspui/handle/123456789/8163
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dc.contributor.authorKumar, A.S.
dc.contributor.authorNagaraja, K.K.
dc.contributor.authorNagaraja, H.S.
dc.date.accessioned2020-03-30T10:18:09Z-
dc.date.available2020-03-30T10:18:09Z-
dc.date.issued2013
dc.identifier.citationAIP Conference Proceedings, 2013, Vol.1536, , pp.263-264en_US
dc.identifier.urihttp://idr.nitk.ac.in/jspui/handle/123456789/8163-
dc.description.abstractZinc oxide (ZnO) nanostructured films are grown using Polyvinyal alcohol (PVA)-citric acid modified sol gel process and the effect of (0, 1, and 2Wt%) PVA content on growth, crystallanity, microstructure and electrical properties are investigated. The XRD patterns confirm that the films are polycrystalline nature. 1 Wt% assisted grown samples are found to be good crystallanity with (002) preferred orientation. The SEM micrographs confirm that the 1 Wt% PVA assisted grown films are composed of vertically oriented ?1.2 ?m length nanorods. The temperature dependent electrical resistivity of the films has been measured using the four-probe method. The electrical resistivity found to be 7.08 ?-cm at room temperature for vertically oriented nanorods composed films, which are grown using 1Wt% PVA. � 2013 AIP Publishing LLC.en_US
dc.titleGrowth and temperature dependent electrical properties of ZnO nanostructuresen_US
dc.typeBook chapteren_US
Appears in Collections:2. Conference Papers

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