Reliability Monitoring in a Smart NoC Component

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DC Field	Value	Language
dc.contributor.author	Bhowmik B.
dc.contributor.author	Deka J.K.
dc.contributor.author	Biswas S.
dc.date.accessioned	2021-05-05T10:16:14Z	-
dc.date.available	2021-05-05T10:16:14Z	-
dc.date.issued	2020
dc.identifier.citation	ICECS 2020 - 27th IEEE International Conference on Electronics, Circuits and Systems, Proceedings , Vol. , , p. -	en_US
dc.identifier.uri	https://doi.org/10.1109/ICECS49266.2020.9294931
dc.identifier.uri	http://idr.nitk.ac.in/jspui/handle/123456789/15023	-
dc.description.abstract	SMART NoC topology components, such as octagon, spidergon are progressively becoming the primary design choice for implementing the communication backbone in a multi-core SoC platform for lowering a high number of inter-router hops required by long-range traffic. However, aggressive technology scaling has increased the number of transient/permanent faults raising the reliability concerns in a SMART NoC. This paper presents a reliability monitoring scheme for addressing channel-short faults in the basic octagon NoC. Along with the online detection and diagnosis of short faults, an effective scheduling scheme is proposed to provide a low-cost test solution that outperforms over a set of prior schemes. © 2020 IEEE.	en_US
dc.title	Reliability Monitoring in a Smart NoC Component	en_US
dc.type	Conference Paper	en_US
Appears in Collections:	2. Conference Papers

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